Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits
نویسندگان
چکیده
Shorts and opens are the most common types of defects in today’s CMOS ICs. In this paper we show for the first time that an open in the interconnect wiring of a digital CMOS circuit can cause oscillation or sequential behavior. We also analyze and compare the factors affecting the probabilities for an interconnect open and a feedback bridging fault to oscillate or display sequential behavior.
منابع مشابه
Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits
Shorts and opens are the most common types of catastrophic defects in today's CMOS ICs. In this paper we show that an open in the interconnect wiring of a digital CMOS circuit, which permanently disconnects inputs of logic gates from their driver, can cause oscillation or sequential behavior. We present supporting experimental data collected by creating an interconnect open in a manufactured ch...
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